INTRODUCTION
The standards for Safety Instrumented Systems (SISs), Electrotechnical Commission and require that Safety Integrity Levels (SILs) be determined for Safety Instrumented Functions (SIFs) to meet tolerable risk criteria. The standards identify several methods that can be used for this purpose including Layers of Protection Analysis (LOPA), risk graphs and risk matrices. This course explains how these methods can be used. A detailed procedure is provided for using LOPA for SIL determination.
PROGRAM OBJECTIVES
- Gaining an in-depth knowledge of OSHA Process Safety Management (PSM)
- Learning how to perform a LOPA study to evaluate the effectiveness of process safeguards
- Being able to determine required SILs for SIFs using LOPA, risk graphs and risk matrices
- Improving safety skills through techniques in process safety management
- Promoting business continuity improvement through understanding of safer systems design
WHO SHOULD ATTEND?
- Process safety personnel
- Control systems engineers
- Project engineers
- Facility personnel who are involved in implementing standards for safety instrumented systems
PROGRAM OUTLINE
- Introduction
- Overview
- Requirements of SIS standards
- Concept of hazardous events for SIFs
- Meaning and development of risk criteria
- Use of risk matrices
- Use of risk graphs
- Process Safety Concepts
- Overview of LOPA
- Use of LOPA
- Documentation and example application
- Selection of hazard scenarios
- Definition of scenario consequences
- Identification of initiating events
- Consideration of enablers
- Failure data
- Making risk decisions
- Remaining Steps
- Understanding protection layers
- Other uses of LOPA
- SIL Terms and concepts
- Requirements for SIL verification
- Reliability metrics
- SIL determination
- SIS components and their failures
- Diagnostics
- Common cause failures
- Failure modes, effects and diagnostic analysis
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